EDWARD YANOWITZ was born May 25,1946 in Miami, Fl., raised in Nassau, Bahamas and Miami Beach, Fl. In 1972, he received a Masters of Fine Arts degree in Photography, from The San Francisco Art Institute, where he studied with Tony Ray-Jones, John Collier Jr., and Pirkle Jones. In 1974, four photographs were selected by John Szarkowski, for the collection of The Museum of Modern Art in New York City. In 1979, six photographs were chosen for a series of Christmas definitive postage stamps for the Bahamas, with an official first day cover. In 1992, He was retained as expert witness, documentary photographer, and coordinator of photography for the defense, in the William Kennedy Smith vs. the State of Florida trial. Recently retired Professor of photography, His photographs are held in corporate and private collections both nationally and internationally.